KEYNOTE SPEAKERS

Prof. Arie den Boef
Vrije Universiteit, Amsterdam and Corporate Fellow at ASML

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Biodata: Arie den Boef is a Corporate Fellow at ASML where he is involved in research on optical wafer metrology. He joined ASML in 1997 and since 2016 he is also a part-time full professor at the Vrije Universiteit in Amsterdam and a part-time group leader of the “Computational Imaging” group at the Advanced Research Center for Nano Lithography in Amsterdam (ARCNL). From 1995 till 1997 he worked at Philips Optical Storage as a System Engineer for optical recording systems. From 1992-1995 he was at Philips Medical Systems working on Magnetic Resonance Imaging. Before joining Medical Systems Arie was at Philips Research Laboratories from 1979 – 1992 where he was involved in laser diode characterization and research on optical measurement systems for industrial inspection. Arie received a B.Sc. degree in electrical engineering in 1985 from the Eindhoven Polytechnic Institute and a Ph.D. degree in 1991 from the department of Physics from the University of Twente, The Netherlands. The topic of his Ph.D. thesis was “Scanning Force Microscopy using Optical Interferometry”.

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Biodata: Vittorio Murino is full professor at the University of Verona, Italy, and director of the PAVIS (Pattern Analysis and Computer Vision) department at the Istituto Italiano di Tecnologia. He took the Laurea degree in Electronic Engineering in 1989 and the Ph.D. in Electronic Engineering and Computer Science in 1993 at the University of Genova, Italy. He was chairman of the Department of Computer Science from 2001, year of foundation, to 2007, and coordinator of the Ph.D. program in Computer Science in the same university from 1999 to 2003. Prof. Murino is scientific responsible of several national and European projects, and evaluator of EU project proposals related to several frameworks and programs. Currently, he is working at the Istituto Italiano di Tecnologia in Genova, Italy, leading PAVIS department involved in computer vision, machine learning, and image analysis activities. His main research interests include computer vision, pattern recognition and machine learning, more specifically, statistical and probabilistic techniques for image and video processing, with applications on (human) behavior analysis and related applications such as video surveillance, biomedical imaging, and bioinformatics. Prof. Murino is co-author of more than 300 papers published in refereed journals and international conferences, member of the technical committees of important conferences (CVPR, ICCV, ECCV, ICPR, ICIP, etc.), and guest co-editor of special issues in relevant scientific journals. He is also member of the editorial board of Pattern Recognition, Pattern Analysis and Applications, Machine Vision & Applications, and Computer Vision and Image Understanding journals, as well as of IEEE Transactions on Cybernetics. Finally, prof. Murino is senior member of the IEEE and Fellow of the IAPR.