SPEAKERS

 

Dr. Richard Kowarschik
Institute of Applied Optics & Biophysics, Friedrich-Schiller-University Jena, Germany

Title: 3D shape measurement with structured light using statistical patterns
Abstract: Optical 3D shape measurement methods like fringe projection play a significant role in industrial metrology and in many other areas of science and technology. In addition, methods that work with the projection of statistical patterns are becoming increasingly important. Statistical patterns can be generated more easily and usually also projected faster, so that the measurement speed is no longer limited by the projection system. An important example is the combination of stereophotogrammetry with the projection of statistical patterns like incoherent band-limited or coherent patterns (laser speckles). Since the statistical patterns do not need to be known in terms of their actual structure, new projection methods are possible. Laser speckles offer the advantages of high contrast and spectral narrowband. One key point for the further development of these 3D measurement methods is the inspection of objects that behave uncooperatively in the visible spectral range (VIS) by the transition to IR or UV wavelengths. Another is the realization of more compact and miniaturized setups based on single-camera systems in combination with the repeatable projection of the patterns. Moreover, the successful establishment of these 3D measurement methods requires a precise characterization of their parameters and the comparison with established shape measurement methods.

Biodata: TBA

Dr. Daniel Claus
Swiss Optic Group AG, Switzerland

Title: Ultra-high speed MHz optical metrology applied to uncooperative technical and medical samples
Abstract: This talk will deal with various optical metrology techniques for the estimation of the 3D topography for industrial and medical applications.
The information provided via optical metrology must fulfill a large range of boundary conditions such as optical resolution, height measurement uncertainty, measurement speed and measurement sample including the measurement environment.
The technologies, which will be discussed in this presentation are focused on ultra-high speed 3D topographic metrology systems offering data rates of a few Mhz. It will be demonstrated that these systems work well at harsh environmental conditions such as manufacturing workshop or as a handheld device in clinical applications (continuously changing reference coordinate system). Moreover, the difference in samples, such as technical metallic surface that are solely specular reflective and surface scattering or semitransparent biomedical samples, which are volume scattering, significantly influences the choice of metrology technique.
With regards to the boundary conditions and application scenario different metrology systems will be presented based on chromatic confocal point sensors, chromatic confocal multi point sensors and single shot dual wavelength area sensor.
All of which are perfectly suited for their specific task, which will be highlighted within the presentation.

Biodata: Daniel Claus finished his master’s degree in mechanical engineering at the Technische Universität (TU) Ilmenau in 2006. After a short spell as a scientific assistant at the TU-Ilmenau, he started his PhD at the University of Warwick (UK) in 2007.During his PhD he focused on resolution improvement methods applied to digital holographic interferometry for metrology and medical applications. After finishing his PhD in 2010 he started a postdoc position at the Kroto research institute in Sheffield, where he was working on phase retrieval imaging and in particular ptychography. From 2013 to 2017 he got the position of a senior scientist at the Institut für Technische Optik (ITO) at the Universität Stuttgart, working on elastography, adaptive chromatic confocal multipoint imaging, waveoptical signal modelling and coherent imaging. In 2017 he moved to the Institut für Lasertechnologien in der Medizin und Messtechnik in Ulm, where he was leading the optical metrology group. His work there was predominately focused on high-speed imaging based on interferometry and chromatic confocal imaging in an industrial context. Since 2022 he holds the position of a project leader and systems engineer at Swiss optics, developing optical systems for medical applications.

Dr. Alexander Bertz
Gruppenleiter Geometrische Inline-Messsysteme stellv. Abteilungsleiter Produktionskontrolle Fraunhofer IPM, Germany

Title: Digital Holography - A highly versatile technology for 3D measurement
Abstract: The demands on modern quality assurance - and therefore on metrology - are immense. Measuring tasks are becoming more and more complex, while at the same time shorter measuring times and higher inspection rates are required.
Optical measuring methods offer flexibility, high measuring speeds and the possibility of comprehensive measurements - especially when it comes to measuring precisely manufactured surfaces or detecting the smallest defects on large surfaces. In recent years, the Fraunhofer Institute for Physical Measurement Techniques IPM has shown that digital holography in particular offers superior potential. With a sampling rate of > 300 million points/s (area measurement), single point repeatability of significantly better than 1 µm can be achieved even under production conditions.
In this talk we will give a short introduction to digital holography and present the current status of digital holographic sensor technology for industrial quality assurance using real-life examples.

Biodata: Alexander Bertz was born in Heidelberg in 1980 and studied physics at the Technical University of Darmstadt. He received his diploma in physics in 2005. He received his PhD from the Technical University of Darmstadt in 2010 for his work on a novel detector setup for hydrogen dimers for the realisation of a loophole-free Bell experiment. Since 2011 he has been working at the Fraunhofer Institute for Physical Measurement Techniques IPM in Freiburg. For the first successful integration of a holographic measurement system into a production line, he was awarded the Joseph von Fraunhofer Prize in 2017. He is currently head of a group specialising in the development of innovative 3D measurement systems primarily based on digital holography and deputy head of the production control department.